Micro-XRF

X-ray microfluorescence allows localized analysis of a sample with a maximum spatial resolution of around 20 µm. It is possible to detect elements from sodium to uranium with variable detection limits: from a few percent for the lightest elements (sodium) to less than ten ppm for the elements most sensitive to this technique (e.g. zirconium). It is also possible to quickly map centimetric samples without extended preparation (flat sample but no polishing or coating).

The SCMEM is equipped with a Bruker M4 Tornado µXRF.

Technical specifications

• X-ray tube (Rh source) with polycapillary optics to focus the beam and achieve high brightness in a spot size of 100µm or 20µm
• Two Bruker XFlash (SDD-type) detectors to increase acquisition speed, identify diffraction peaks and limit shadowing effects on non-planar samples
• Analysis from Na under vacuum and from K at atmospheric pressure

Application examples

Example of Mn mapping in an apatite crystal (dimension 3 cm) revealing growth bands, and allowing to link certain types of fluid inclusions to the growth or cracking stages of the crystal.

Example of chemical mapping on a 15 cm long core (As in red, Si in grey, Zn in green, Cu in yellow, Fe in blue, S in pink)